Abstract
Trace ratio is a natural criterion in discriminant analysis as it directly connects to the Euclidean distances between training data points. This criterion is re-analyzed in this paper and a fast algorithm is developed to find the global optimum for the orthogonal constrained trace ratio problem. Based on this problem, we propose a novel semi-supervised orthogonal discriminant analysis via label propagation. Differing from the existing semi-supervised dimensionality reduction algorithms, our algorithm propagates the label information from the labeled data to the unlabeled data through a specially designed label propagation, and thus the distribution of the unlabeled data can be explored more effectively to learn a better subspace. Extensive experiments on toy examples and real-world applications verify the effectiveness of our algorithm, and demonstrate much improvement over the state-of-the-art algorithms.
| Original language | English |
|---|---|
| Pages (from-to) | 2615-2627 |
| Number of pages | 13 |
| Journal | Pattern Recognition |
| Volume | 42 |
| Issue number | 11 |
| DOIs | |
| State | Published - Nov 2009 |
| Externally published | Yes |
Keywords
- Dimensionality reduction
- Discriminant analysis
- Semi-supervised learning
- Subspace learning
- Trace ratio