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Robust ellipse fitting via alternating direction method of multipliers

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25 Scopus citations

Abstract

The edge point errors, especially outliers, introduced in the edge detection step, will cause severe performance degradation in ellipse fitting. To address this problem, we adopt the ℓp-norm with p < 2 in the direct least square fitting method to achieve outlier resistance, and develop a robust ellipse fitting approach using the alternating direction method of multipliers (ADMM). Especially, to solve the formulated nonconvex and nonlinear problem, we decouple the ellipse parameter vector in the nonlinear ℓp-norm objective function from the nonconvex quadratic constraint via introducing auxiliary variables, and estimate the ellipse parameter vector and auxiliary variables alternately via the derived numerical methods. Simulation and experimental examples are presented to demonstrate the robustness of the proposed approach.

Original languageEnglish
Pages (from-to)30-40
Number of pages11
JournalSignal Processing
Volume164
DOIs
StatePublished - Nov 2019

Keywords

  • Alternating direction method of multipliers (ADMM)
  • Ellipse fitting
  • Ellipse parameter vector
  • Nonconvex optimization
  • Nonlinear optimization
  • Outlier

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