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Research on the design methodology of accelerated thermal cycling test for train electronic assemblies basing on PoF

  • China Academy of Railway Sciences
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Recently thermal cycling tests for train electronic assemblies have been widely applied to eliminating latent defects and improving the reliability of the electronics. Considering the cost and schedule, accelerate thermal cycling (ATC) tests are conducted instead of normal tests. In this paper, the design methodology of ATC tests for electronic assemblies is studied. Moreover, the procedure of test design is established basing on Physics of Failure (PoF). The thermal cycling condition feature matrix and the electronic assemblies feature matrix are defined. Using Engelmaier model, the electronic assemblies life feature matrix in both normal and accelerate temperature conditions are consequently calculated. Comparing the two life prediction results, ATC test scheme equivalent to the normal test is determined. What's more, the ATC test scheme for a train traction monitor parameter acquisition circuit is designed as a case study.

Original languageEnglish
Title of host publicationProceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016
EditorsQiang Miao, Zhaojun Li, Ming J. Zuo, Liudong Xing, Zhigang Tian
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509027781
DOIs
StatePublished - 16 Jan 2017
Externally publishedYes
Event7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 - Chengdu, Sichuan, China
Duration: 19 Oct 201621 Oct 2016

Publication series

NameProceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

Conference

Conference7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016
Country/TerritoryChina
CityChengdu, Sichuan
Period19/10/1621/10/16

Keywords

  • Accelerate factor
  • Accelerate thermal cycling test
  • Electronic assemblies
  • PoF

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