Preparation and characterization of self-assembled organic-inorganic nacre-like nanocomposite thin films

Shengmao Zhang; Jingwei Zhang; Zhijun Zhang; Hongxin Dang; Weimin Liu; Qunji Xue

doi:10.1016/j.matlet.2004.01.030

Preparation and characterization of self-assembled organic-inorganic nacre-like nanocomposite thin films

Shengmao Zhang
, Jingwei Zhang
, Zhijun Zhang
, Hongxin Dang
, Weimin Liu
, Qunji Xue

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

The SiO₂/Poly(DMCB) nanocomposite thin films were prepared by supermolerculer self-assembly method on glass substrate. In the nanocomposite thin films, the surfactant DMCB was used as both structure-directing agents and poly monomers. The structures of the films were characterized using FT-IR, XRD and TEM. The results indicated that the films were composed of organic and inorganic layers with orderly interlaced arrangement and the distance between organic layer and inorganic layer was 3.48 nm before polymerization and 2.84 nm after polymerization, respectively.

Original language	English
Pages (from-to)	2266-2269
Number of pages	4
Journal	Materials Letters
Volume	58
Issue number	17-18
DOIs	https://doi.org/10.1016/j.matlet.2004.01.030
State	Published - 1 Jul 2004
Externally published	Yes

Keywords

Nacre-like
Nanocomposite
Self-assembled
SiO
Thin film
X-ray diffraction

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10.1016/j.matlet.2004.01.030

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@article{cf11104648a04df8b6995622a72153f8,

title = "Preparation and characterization of self-assembled organic-inorganic nacre-like nanocomposite thin films",

abstract = "The SiO2/Poly(DMCB) nanocomposite thin films were prepared by supermolerculer self-assembly method on glass substrate. In the nanocomposite thin films, the surfactant DMCB was used as both structure-directing agents and poly monomers. The structures of the films were characterized using FT-IR, XRD and TEM. The results indicated that the films were composed of organic and inorganic layers with orderly interlaced arrangement and the distance between organic layer and inorganic layer was 3.48 nm before polymerization and 2.84 nm after polymerization, respectively.",

keywords = "Nacre-like, Nanocomposite, Self-assembled, SiO, Thin film, X-ray diffraction",

author = "Shengmao Zhang and Jingwei Zhang and Zhijun Zhang and Hongxin Dang and Weimin Liu and Qunji Xue",

year = "2004",

month = jul,

day = "1",

doi = "10.1016/j.matlet.2004.01.030",

language = "英语",

volume = "58",

pages = "2266--2269",

journal = "Materials Letters",

issn = "0167-577X",

publisher = "Elsevier B.V.",

number = "17-18",

}

TY - JOUR

T1 - Preparation and characterization of self-assembled organic-inorganic nacre-like nanocomposite thin films

AU - Zhang, Shengmao

AU - Zhang, Jingwei

AU - Zhang, Zhijun

AU - Dang, Hongxin

AU - Liu, Weimin

AU - Xue, Qunji

PY - 2004/7/1

Y1 - 2004/7/1

N2 - The SiO2/Poly(DMCB) nanocomposite thin films were prepared by supermolerculer self-assembly method on glass substrate. In the nanocomposite thin films, the surfactant DMCB was used as both structure-directing agents and poly monomers. The structures of the films were characterized using FT-IR, XRD and TEM. The results indicated that the films were composed of organic and inorganic layers with orderly interlaced arrangement and the distance between organic layer and inorganic layer was 3.48 nm before polymerization and 2.84 nm after polymerization, respectively.

AB - The SiO2/Poly(DMCB) nanocomposite thin films were prepared by supermolerculer self-assembly method on glass substrate. In the nanocomposite thin films, the surfactant DMCB was used as both structure-directing agents and poly monomers. The structures of the films were characterized using FT-IR, XRD and TEM. The results indicated that the films were composed of organic and inorganic layers with orderly interlaced arrangement and the distance between organic layer and inorganic layer was 3.48 nm before polymerization and 2.84 nm after polymerization, respectively.

KW - Nacre-like

KW - Nanocomposite

KW - Self-assembled

KW - SiO

KW - Thin film

KW - X-ray diffraction

UR - https://www.scopus.com/pages/publications/2542496346

U2 - 10.1016/j.matlet.2004.01.030

DO - 10.1016/j.matlet.2004.01.030

M3 - 文章

AN - SCOPUS:2542496346

SN - 0167-577X

VL - 58

SP - 2266

EP - 2269

JO - Materials Letters

JF - Materials Letters

IS - 17-18

ER -

Preparation and characterization of self-assembled organic-inorganic nacre-like nanocomposite thin films

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Keywords

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