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Point defects in Cd0.95Zn0.05Te

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Abstract

A point defect model for the binary compound CdTe proposed in a former paper is generalized to Cd1-xZnxTe. In Cd 0.95Zn0.05Te crystals, Cdi ̇̇ is found to be the main point defect at high Cd partial pressures, and V″Cd at low partial pressures. On the Te-rich side, the concentrations of Tecȧ̇ and Te cȧ are sufficiently high to significantly influence the electrical properties of Cd0.95Zn0.05Te. Excess Te in Te-rich crystals may result in ionized Cd vacancies and Te anti-sites while excess Cd in Cd-rich Cd0.95Zn0.05Te may exist as Cd interstitials. A detailed recipe for the post-growth annealing of Cd 0.95Zn0.05Te is suggested following calculations based on the model.

Original languageEnglish
Pages (from-to)219-224
Number of pages6
JournalJournal of Crystal Growth
Volume257
Issue number3-4
DOIs
StatePublished - Oct 2003

Keywords

  • A1. Annealing
  • A1. Point defects
  • A1. Quasichemical equilibrium
  • B1. Cd ZnTe

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