Abstract
A point defect model for the binary compound CdTe proposed in a former paper is generalized to Cd1-xZnxTe. In Cd 0.95Zn0.05Te crystals, Cdi ̇̇ is found to be the main point defect at high Cd partial pressures, and V″Cd at low partial pressures. On the Te-rich side, the concentrations of Tecȧ̇ and Te cȧ are sufficiently high to significantly influence the electrical properties of Cd0.95Zn0.05Te. Excess Te in Te-rich crystals may result in ionized Cd vacancies and Te anti-sites while excess Cd in Cd-rich Cd0.95Zn0.05Te may exist as Cd interstitials. A detailed recipe for the post-growth annealing of Cd 0.95Zn0.05Te is suggested following calculations based on the model.
| Original language | English |
|---|---|
| Pages (from-to) | 219-224 |
| Number of pages | 6 |
| Journal | Journal of Crystal Growth |
| Volume | 257 |
| Issue number | 3-4 |
| DOIs | |
| State | Published - Oct 2003 |
Keywords
- A1. Annealing
- A1. Point defects
- A1. Quasichemical equilibrium
- B1. Cd ZnTe
Fingerprint
Dive into the research topics of 'Point defects in Cd0.95Zn0.05Te'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver