Abstract
A photoconductive gain (up to 400%) is observed in a 4-hydroxycyanobenzene (4HCB, C7H5NO) bulk organic semiconducting detector, resulting in a high sensitivity of 38.8 μC Gyair-1 s-1 cm-2 under 50 kVp X-ray beam irradiation. The gain variation tendency as the function of both the applied bias voltage and the incident X-ray dose rate is revealed. A rising stage at the gain versus dose rate curve is observed at the low-flux range of X-ray irradiation, attributed to the trap-filling process. A deep-trapping dependent model is proposed, in which the hole injection assisted by trapped electrons is responsible for the gain.
| Original language | English |
|---|---|
| Article number | 071004 |
| Journal | Applied Physics Express |
| Volume | 13 |
| Issue number | 7 |
| DOIs | |
| State | Published - 1 Jul 2020 |
Fingerprint
Dive into the research topics of 'Photoconductive gain under low-flux X-ray irradiation in 4HCB organic single crystal detectors'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver