Panel-allocated defect SRRs effect in X-band LHMs

Lei Kang, Chunrong Luo, Qian Zhao, Juan Song, Quanhong Fu, Xiaopeng Zhao

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

We experimentally investigated the defect effects of LHMs when panel-allocated defects SRRs are introduced. By measuring the X-band transmission through metamaterial with different sizes and orientations panel-allocated defect SRRs, it was found that characters of resonant peak, including resonance frequency, magnitude and band pass, markedly change. And the panel-allocated defects in LHMs have more effect on electromagnetic behavior than that of dot and linear ones. It is thought that the existences of panel-allocated defects break the symmetry of perfect LHMs and result in a new electromagnetic resonance.

Original languageEnglish
Pages (from-to)2440-2442
Number of pages3
JournalChinese Science Bulletin
Volume49
Issue number23
DOIs
StatePublished - 2004

Keywords

  • LHMs
  • Panel-allocated defect SRRs
  • Resonance

Fingerprint

Dive into the research topics of 'Panel-allocated defect SRRs effect in X-band LHMs'. Together they form a unique fingerprint.

Cite this