Abstract
Indium-doped Cd1-xZnxTe (CZT:In) single crystals were annealed by a two-step method, including a high-temperature step and a low-temperature step in sequence. IR transmittance spectrum, I-V curve and PL spectrum were used to characterize the CZT single crystals. After annealing, the opto-electrical properties of the CZT:In crystals were improved obviously. The average IR transmittance was remarkably increased by about 23%, and the resistivity was enhanced by as high as four orders of magnitude. In the PL spectra, the intensity of the (D0, X) peak prominently increased, and the full-width-at-half-maximum was reduced. Meanwhile, the intensity of the DAP peak decreased greatly, and the structure became practically indistinguishable from the background. Moreover, the intensity of the Dcomplex peak also decreased. The investigation shows that these improvements in the physical properties after annealing are due to variations in the micro-structures. The two-step annealing method can eliminate precipitates/inclusions, remove impurities, compensate Cd vacancies, decrease dislocations and reduce internal stress.
| Original language | English |
|---|---|
| Pages (from-to) | 2876-2880 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 312 |
| Issue number | 20 |
| DOIs | |
| State | Published - 1 Oct 2010 |
Keywords
- A1. Defects
- A1. Impurities
- B1. Cadmium compounds
- B2. Semiconducting II-VI materials
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