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Optical property analysis of CZT:In single crystals after annealing by a two-step method

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Abstract

Indium-doped Cd1-xZnxTe (CZT:In) single crystals were annealed by a two-step method, including a high-temperature step and a low-temperature step in sequence. IR transmittance spectrum, I-V curve and PL spectrum were used to characterize the CZT single crystals. After annealing, the opto-electrical properties of the CZT:In crystals were improved obviously. The average IR transmittance was remarkably increased by about 23%, and the resistivity was enhanced by as high as four orders of magnitude. In the PL spectra, the intensity of the (D0, X) peak prominently increased, and the full-width-at-half-maximum was reduced. Meanwhile, the intensity of the DAP peak decreased greatly, and the structure became practically indistinguishable from the background. Moreover, the intensity of the Dcomplex peak also decreased. The investigation shows that these improvements in the physical properties after annealing are due to variations in the micro-structures. The two-step annealing method can eliminate precipitates/inclusions, remove impurities, compensate Cd vacancies, decrease dislocations and reduce internal stress.

Original languageEnglish
Pages (from-to)2876-2880
Number of pages5
JournalJournal of Crystal Growth
Volume312
Issue number20
DOIs
StatePublished - 1 Oct 2010

Keywords

  • A1. Defects
  • A1. Impurities
  • B1. Cadmium compounds
  • B2. Semiconducting II-VI materials

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