Abstract
An exact solution of solute diffusion for the stoichiometric-compound/ stoichiometric-compound eutectic is derived for a planar interface. Compared with the previous work, the solution is consistent with the kinetics of triple-junction, i.e. the eutectic composition is necessarily found at the triple-junction. Adopting an averaged conservation law at the interface, a general solution is proposed for any kind of eutectics and phase diagrams. Simulation results in the Ni5Si2-Ni3Si eutectic growth show that the general solution is a good approximation. The current work makes it possible to incorporate the kinetics of triple-junction into the eutectic growth model.
| Original language | English |
|---|---|
| Pages (from-to) | 68-73 |
| Number of pages | 6 |
| Journal | Journal of Crystal Growth |
| Volume | 389 |
| DOIs | |
| State | Published - 1 Mar 2014 |
Keywords
- A1. Diffusion
- A1. Eutectics
- A1. Solidification
- B1. Alloys
Fingerprint
Dive into the research topics of 'On the solution of solute diffusion during eutectic growth'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver