Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy

Boru Zhou; Wanqi Jie; Tao Wang; Zongde Kou; Dou Zhao; Liying Yin; Fan Yang; Shouzhi Xi; Gangqiang Zha; Ziang Yin

doi:10.3390/cryst8010026

Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy

Boru Zhou
, Wanqi Jie
, Tao Wang
, Zongde Kou
, Dou Zhao
, Liying Yin
, Fan Yang
, Shouzhi Xi
, Gangqiang Zha
, Ziang Yin

School of Materials Sience and Engineering

Northwestern Polytechnical University Xian

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [112]_M// [0001]_P and (111)_M// (1100)_P. A ledge growth interface with the preferred orientation along the [111]_M and [110]_M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.

Original language	English
Article number	26
Journal	Crystals
Volume	8
Issue number	1
DOIs	https://doi.org/10.3390/cryst8010026
State	Published - 10 Jan 2018

Keywords

CdZnTe
Defects in semiconductors
Interface structure
Precipitation
Transmission electron microscopy (TEM)
Traveling heater method

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10.3390/cryst8010026

Cite this

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title = "Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy",

abstract = "Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [112]M// [0001]P and (111)M// (1100)P. A ledge growth interface with the preferred orientation along the [111]M and [110]M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.",

keywords = "CdZnTe, Defects in semiconductors, Interface structure, Precipitation, Transmission electron microscopy (TEM), Traveling heater method",

author = "Boru Zhou and Wanqi Jie and Tao Wang and Zongde Kou and Dou Zhao and Liying Yin and Fan Yang and Shouzhi Xi and Gangqiang Zha and Ziang Yin",

note = "Publisher Copyright: {\textcopyright} 2018 by the authors. Licensee MDPI, Basel, Switzerland.",

year = "2018",

month = jan,

day = "10",

doi = "10.3390/cryst8010026",

language = "英语",

volume = "8",

journal = "Crystals",

issn = "2073-4352",

publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",

number = "1",

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TY - JOUR

T1 - Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy

AU - Zhou, Boru

AU - Jie, Wanqi

AU - Wang, Tao

AU - Kou, Zongde

AU - Zhao, Dou

AU - Yin, Liying

AU - Yang, Fan

AU - Xi, Shouzhi

AU - Zha, Gangqiang

AU - Yin, Ziang

PY - 2018/1/10

Y1 - 2018/1/10

N2 - Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [112]M// [0001]P and (111)M// (1100)P. A ledge growth interface with the preferred orientation along the [111]M and [110]M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.

AB - Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [112]M// [0001]P and (111)M// (1100)P. A ledge growth interface with the preferred orientation along the [111]M and [110]M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.

KW - CdZnTe

KW - Defects in semiconductors

KW - Interface structure

KW - Precipitation

KW - Transmission electron microscopy (TEM)

KW - Traveling heater method

UR - https://www.scopus.com/pages/publications/85040972727

U2 - 10.3390/cryst8010026

DO - 10.3390/cryst8010026

M3 - 文章

AN - SCOPUS:85040972727

SN - 2073-4352

VL - 8

JO - Crystals

JF - Crystals

IS - 1

M1 - 26

ER -

Observations on nanoscale te precipitates in CdZnTe crystals grown by the traveling heater method using high resolution transmission electron microscopy

Abstract

Keywords

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