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Nounique phenomenon of rocking curve on (111) surfaces of CdZnTe wafers

  • Northwestern Polytechnical University Xian

Research output: Contribution to journalArticlepeer-review

Abstract

The nounique phenomenon of rocking curve on the (111) surfaces of CdZnTe wafers was first discovered in X-ray diffraction measurement. The reason of the nounique phenomenon of rocking curve came into being was that both (333) plane and (3̄3̄3̄) plane meet the Bragg diffraction. Two diffraction peaks were recorded in X-ray diffraction measurement in the course of 360° of rotation about phi axis. By optimizing each diffraction peak, we obtained two rocking curves. One rocking curve is from the (333) plane, and the other is from the (3̄3̄3̄) plane. After analyzing the scattered capacity of (333) plane and (3̄3̄3̄) planes to X-ray, we concluded that the diffraction intensity of the (333) plane is smaller than that of the (3̄3̄3̄) plane, and the intensity of the rocking curve on (333) plane is also smaller than that of the (3̄3̄3̄) plane.

Original languageEnglish
Pages (from-to)80-83
Number of pages4
JournalPan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
Volume28
Issue numberSUPPL.
StatePublished - Sep 2007

Keywords

  • CdZnTe
  • Nounique phenomenon
  • Rocking curve
  • Structure factor

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