Abstract
A C/SiC composite panel with defects of known size and of familiar nature was manufactured successfully for nondestructive evaluation. A computed tomography (CT) system was used to detect embedded defects. The results show that CT imaging corresponds well with the designed defects. The defect-embedded composites undergo relatively greater loss in tensile strength and failure strain than the as-received samples, although their initial Young's moduli are almost identical. It is also observed that the embedded defects make a significant contribution toward the initiation and accumulation of the damage in the composites, which result eventually in the early failure of the composite.
| Original language | English |
|---|---|
| Pages (from-to) | 378-386 |
| Number of pages | 9 |
| Journal | International Journal of Applied Ceramic Technology |
| Volume | 4 |
| Issue number | 4 |
| DOIs | |
| State | Published - Aug 2007 |
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