Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics

Zhicao Zhao; Baowei Song; Xinping Wang; Guozhen Zhang

doi:10.1007/978-3-642-23881-9_4

Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics

Zhicao Zhao
, Baowei Song
, Xinping Wang
, Guozhen Zhang

School of Marine Science and Technology

Northwestern Polytechnical University Xian

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

For the application of double alternative step-stress accelerated life test in the life assessment of modern high reliable and long life electronic equipment, the maximum likelihood estimation (MLE) method is applied to make its life and reliability assessment in operating stress. With electronic product failure obeying exponential distribution, the likelihood equations of acceleration model parameters were established according to time convert. On the basis of acceleration model parameters and Fisher information matrix, the maximum likelihood estimation and approximate confidence interval of life expectancy in operating stress were acquired. In the end, random simulation method was used to prove the validity and advantages of the statistical method above compared with other method.

Original language	English
Title of host publication	Artificial Intelligence and Computational Intelligence - Third International Conference, AICI 2011, Proceedings
Pages	27-34
Number of pages	8
Edition	PART 1
DOIs	https://doi.org/10.1007/978-3-642-23881-9_4
State	Published - 2011
Event	3rd International Conference on Artificial Intelligence and Computational Intelligence, AICI 2011 - Taiyuan, China Duration: 24 Sep 2011 → 25 Sep 2011

Publication series

Name	Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Number	PART 1
Volume	7002 LNAI
ISSN (Print)	0302-9743
ISSN (Electronic)	1611-3349

Conference

Conference	3rd International Conference on Artificial Intelligence and Computational Intelligence, AICI 2011
Country/Territory	China
City	Taiyuan
Period	24/09/11 → 25/09/11

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 3 Good Health and Well-being

Keywords

Double alternative step-stress accelerated life test
Electronics
Exponential distribution
Fisher information matrix
Maximum likelihood estimation (MLE)

Access to Document

10.1007/978-3-642-23881-9_4

Cite this

Zhao, Z., Song, B., Wang, X., & Zhang, G. (2011). Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics. In Artificial Intelligence and Computational Intelligence - Third International Conference, AICI 2011, Proceedings (PART 1 ed., pp. 27-34). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 7002 LNAI, No. PART 1). https://doi.org/10.1007/978-3-642-23881-9_4

Zhao, Zhicao ; Song, Baowei ; Wang, Xinping et al. / Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics. Artificial Intelligence and Computational Intelligence - Third International Conference, AICI 2011, Proceedings. PART 1. ed. 2011. pp. 27-34 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); PART 1).

@inproceedings{689632838d944e8c97ca5602e740048e,

title = "Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics",

abstract = "For the application of double alternative step-stress accelerated life test in the life assessment of modern high reliable and long life electronic equipment, the maximum likelihood estimation (MLE) method is applied to make its life and reliability assessment in operating stress. With electronic product failure obeying exponential distribution, the likelihood equations of acceleration model parameters were established according to time convert. On the basis of acceleration model parameters and Fisher information matrix, the maximum likelihood estimation and approximate confidence interval of life expectancy in operating stress were acquired. In the end, random simulation method was used to prove the validity and advantages of the statistical method above compared with other method.",

keywords = "Double alternative step-stress accelerated life test, Electronics, Exponential distribution, Fisher information matrix, Maximum likelihood estimation (MLE)",

author = "Zhicao Zhao and Baowei Song and Xinping Wang and Guozhen Zhang",

year = "2011",

doi = "10.1007/978-3-642-23881-9\_4",

language = "英语",

isbn = "9783642238802",

series = "Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)",

number = "PART 1",

pages = "27--34",

booktitle = "Artificial Intelligence and Computational Intelligence - Third International Conference, AICI 2011, Proceedings",

edition = "PART 1",

note = "3rd International Conference on Artificial Intelligence and Computational Intelligence, AICI 2011 ; Conference date: 24-09-2011 Through 25-09-2011",

}

Zhao, Z, Song, B, Wang, X & Zhang, G 2011, Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics. in Artificial Intelligence and Computational Intelligence - Third International Conference, AICI 2011, Proceedings. PART 1 edn, Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), no. PART 1, vol. 7002 LNAI, pp. 27-34, 3rd International Conference on Artificial Intelligence and Computational Intelligence, AICI 2011, Taiyuan, China, 24/09/11. https://doi.org/10.1007/978-3-642-23881-9_4

Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics. / Zhao, Zhicao; Song, Baowei; Wang, Xinping et al.
Artificial Intelligence and Computational Intelligence - Third International Conference, AICI 2011, Proceedings. PART 1. ed. 2011. p. 27-34 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 7002 LNAI, No. PART 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics

AU - Zhao, Zhicao

AU - Song, Baowei

AU - Wang, Xinping

AU - Zhang, Guozhen

PY - 2011

Y1 - 2011

N2 - For the application of double alternative step-stress accelerated life test in the life assessment of modern high reliable and long life electronic equipment, the maximum likelihood estimation (MLE) method is applied to make its life and reliability assessment in operating stress. With electronic product failure obeying exponential distribution, the likelihood equations of acceleration model parameters were established according to time convert. On the basis of acceleration model parameters and Fisher information matrix, the maximum likelihood estimation and approximate confidence interval of life expectancy in operating stress were acquired. In the end, random simulation method was used to prove the validity and advantages of the statistical method above compared with other method.

AB - For the application of double alternative step-stress accelerated life test in the life assessment of modern high reliable and long life electronic equipment, the maximum likelihood estimation (MLE) method is applied to make its life and reliability assessment in operating stress. With electronic product failure obeying exponential distribution, the likelihood equations of acceleration model parameters were established according to time convert. On the basis of acceleration model parameters and Fisher information matrix, the maximum likelihood estimation and approximate confidence interval of life expectancy in operating stress were acquired. In the end, random simulation method was used to prove the validity and advantages of the statistical method above compared with other method.

KW - Double alternative step-stress accelerated life test

KW - Electronics

KW - Exponential distribution

KW - Fisher information matrix

KW - Maximum likelihood estimation (MLE)

UR - https://www.scopus.com/pages/publications/80054714257

U2 - 10.1007/978-3-642-23881-9_4

DO - 10.1007/978-3-642-23881-9_4

M3 - 会议稿件

AN - SCOPUS:80054714257

SN - 9783642238802

T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

SP - 27

EP - 34

BT - Artificial Intelligence and Computational Intelligence - Third International Conference, AICI 2011, Proceedings

T2 - 3rd International Conference on Artificial Intelligence and Computational Intelligence, AICI 2011

Y2 - 24 September 2011 through 25 September 2011

ER -

Zhao Z, Song B, Wang X, Zhang G. Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics. In Artificial Intelligence and Computational Intelligence - Third International Conference, AICI 2011, Proceedings. PART 1 ed. 2011. p. 27-34. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); PART 1). doi: 10.1007/978-3-642-23881-9_4

Maximum likelihood estimation of double alternative step-stress accelerated life test for electronics

Abstract

Publication series

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UN SDGs

Keywords

Access to Document

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