Material and structural optimization of fatigue life of PBGA under temperature cycling

Wenjie Wang, Yao Yao, Xu Long, Zhenghu Zhu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

Working environment of electronic chips has the characteristics of temperature cycling. This paper establishes a three-dimensional finite element model for coupled thermal-mechanical analysis in ABAQUS to simulate the deformation behavior of solder joints in the plastic ball grid array (PBGA) package under temperature cycling. The cyclic temperature is from 20°C to 125°C with the ramping rate of 105°C/0.2 analysis time and the dwell temperature is 20°C and 125°C. The constitutive models of the incorporated materials especially for Sn-3.0Ag-0.5Cu (SAC305) solder are assigned directly in the 3D FE model, which are scaled according to the applied temperature using the available experiment data in the literature. Furthermore, a modified Coffin-Manson equation is used to establish a fatigue model based on the shear plastic strain. By varying the important factors such as the solder joint height, temperature ramping rate, coefficient of thermal expansion of solder joint and offset distance, the corresponding effect on the fatigue life of the solder joint under thermal cycling is numerically investigated. After comparing the various parameters of the PBGA package, some suggestions are made to emphasize the optimal combination of material properties and structural dimensions.

Original languageEnglish
Title of host publicationProceedings - 2018 19th International Conference on Electronic Packaging Technology, ICEPT 2018
EditorsFei Xiao, Jun Wang, Lin Chen, Tianchun Ye
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages477-481
Number of pages5
ISBN (Electronic)9781538663868
DOIs
StatePublished - 2 Oct 2018
Event19th International Conference on Electronic Packaging Technology, ICEPT 2018 - Shanghai, China
Duration: 8 Aug 201811 Aug 2018

Publication series

NameProceedings - 2018 19th International Conference on Electronic Packaging Technology, ICEPT 2018

Conference

Conference19th International Conference on Electronic Packaging Technology, ICEPT 2018
Country/TerritoryChina
CityShanghai
Period8/08/1811/08/18

Keywords

  • fatigue life
  • PBGA
  • solder joint
  • thermal cycling

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