Abstract
The dielectric ceramics comprised of (Zn1-xMg x)TiO3 (x=0.1-0.5, abbreviated to ZMT) were developed by conventional mixed-oxide method combined with a semi-chemical processing. V 2O5 was used as sintering aids to lower the sintering temperature of ceramics. The results showed that the hexagonal phase stability region extended from 900 to 1150°C as the amount of magnesium increased. The densification temperature of ZMT ceramics could be reduced from 1200 to 875°C by V2O5 additions and using semi-chemical processing, the relative density of ZMT ceramics with 1.00wt% V 2O5 addition reach 95% at 875°C The dielectric properties of ZMT were measured at different frequencies and the results showed that there existed a decreasing tendency of the loss tangents (tg δ) with increasing measuring frequency. It is concluded that εr=22 and tg δ = 5.7×10-4 can be obtained for ZMT ceramics at sintering temperature 875°C.
| Original language | English |
|---|---|
| Title of host publication | Progress in Light Metals, Aerospace Materials and Superconductors |
| Publisher | Trans Tech Publications Ltd |
| Pages | 2215-2218 |
| Number of pages | 4 |
| Edition | PART 4 |
| ISBN (Print) | 0878494324, 9780878494323 |
| DOIs | |
| State | Published - 2007 |
| Event | 2006 Beijing International Materials Week, 2006 BIMW - International Conference on Superconducting Materials, ICSM 2006 - Beijing, China Duration: 25 Jun 2006 → 30 Jun 2006 |
Publication series
| Name | Materials Science Forum |
|---|---|
| Number | PART 4 |
| Volume | 546-549 |
| ISSN (Print) | 0255-5476 |
| ISSN (Electronic) | 1662-9752 |
Conference
| Conference | 2006 Beijing International Materials Week, 2006 BIMW - International Conference on Superconducting Materials, ICSM 2006 |
|---|---|
| Country/Territory | China |
| City | Beijing |
| Period | 25/06/06 → 30/06/06 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 3 Good Health and Well-being
Keywords
- (Zn,Mg)TiO
- Low-temperature sintering
- Phase transition
- X-ray diffraction
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