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Learning Bayesian Sparse Networks with Full Experience Replay for Continual Learning

  • Qingsen Yan
  • , Dong Gong
  • , Yuhang Liu
  • , Anton Van Den Hengel
  • , Javen Qinfeng Shi
  • University of Adelaide
  • University of New South Wales

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

59 Scopus citations

Abstract

Continual Learning (CL) methods aim to enable machine learning models to learn new tasks without catastrophic forgetting of those that have been previously mastered. Existing CL approaches often keep a buffer of previously-seen samples, perform knowledge distillation, or use regularization techniques towards this goal. Despite their performance, they still suffer from interference across tasks which leads to catastrophic forgetting. To ameliorate this problem, we propose to only activate and select sparse neurons for learning current and past tasks at any stage. More parameters space and model capacity can thus be reserved for the future tasks. This minimizes the interference between parameters for different tasks. To do so, we propose a Sparse neural Network for Continual Learning (SNCL), which employs variational Bayesian sparsity priors on the activations of the neurons in all layers. Full Experience Replay (FER) provides effective supervision in learning the sparse activations of the neurons in different layers. A loss-aware reservoir-sampling strategy is developed to maintain the memory buffer. The proposed method is agnostic as to the network structures and the task boundaries. Experiments on different datasets show that SNCL achieves state-of-the-art result for mitigating forgetting.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
PublisherIEEE Computer Society
Pages109-118
Number of pages10
ISBN (Electronic)9781665469463
DOIs
StatePublished - 2022
Externally publishedYes
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022 - New Orleans, United States
Duration: 19 Jun 202224 Jun 2022

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2022-June
ISSN (Print)1063-6919

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2224/06/22

Keywords

  • Deep learning architectures and techniques
  • Machine learning

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