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Laser-induced selective metallization of conductive patterns on silicone via copper carbonate hydroxide coating

  • Yuan Wei
  • , Xueqian Yang
  • , Haifeng Tian
  • , Ruoyan Miao
  • , Hai Tan
  • , Simon S. Park
  • , Xuewen Wang
  • Northwest Agriculture and Forestry University
  • Frontiers Science Center for Flexible Electronics
  • Northwestern Polytechnical University Xian
  • College of Forestry
  • College of Engineering & Computer Science
  • VinUniversity

Research output: Contribution to journal › Article › peer-review

Abstract

Flexible electronics demand stretchable, high-performance interconnects for wearable and implantable applications. However, conventional methods such as direct-ink writing or doped-activator metallization face challenges including thermal degradation risks from high-temperature sintering, complex multi-step chemical procedures with toxic precursors. Here, we introduce an updated laser-induced selective metallization (LISM) for fabricating stretchable copper electrodes directly on a commercial polysiloxane rubber. This approach employs a spray-coated copper carbonate hydroxide activator, followed by near-infrared laser activating. Laser irradiation leads to the reduction of copper ions, along with the formation of amorphous carbon domains and micro-nanoscale surface structures. Electroless copper plating (ECP) and electroplating (EP) are subsequently performed to form continuous, low-resistivity serpentine traces. Comprehensive characterization verifies the successful reduction of copper and the robust integration of the electrode into the substrate. Mechanical testing shows that the structure maintains its electrical performance under repeated cyclic deformation. Functional demonstrations including electrocardiogram (ECG) patch, LED arrays, and wireless antennas showcase practical applicability of the proposed approach. Additionally, LISM operates at ambient temperature without toxic precursors and it minimizes chemical consumption and provides exceptional durability. This method advances next-generation electronics requiring both mechanical flexibility and electrical reliability. (Figure presented.)

Original languageEnglish
Article number96
JournalMicrosystems and Nanoengineering
Volume12
Issue number1
DOIs
StatePublished - Dec 2026

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