Abstract
The crystal internal defects of RDX/HMX were studied by optical microscopy with matching refractive(OMS), small angle scattering of X-ray(SASX), atomic force microscope(AFM), sink-fload method(SFM) and Mirco-CT. OMS and AFM results show that RDX/HMX has more defects and cracks than reduced sensitivity-RDX/reduced sensitivity-HMX. SASX results show that crystal internal defects of RDX/HMX are larger than that of RS-RDX/RS-HMX, and mirco-CT results show that RDX has larger internal defects than RS-RDX. Furthermore, shock sensitivity of RDX based PBXs and RS-RDX based PBXs were studied, and the results show that internal defects of RDX has great influence on shock sensitivity of RDX.
| Original language | English |
|---|---|
| Pages (from-to) | 152-156 |
| Number of pages | 5 |
| Journal | Hanneng Cailiao/Chinese Journal of Energetic Materials |
| Volume | 18 |
| Issue number | 2 |
| DOIs | |
| State | Published - Apr 2010 |
| Externally published | Yes |
Keywords
- Characterization method
- Crystal internal defect
- Explosion mechanics
- Reduced sensitivity HMX
- Reduced sensitivity RDX
- Shock sensitivity
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