Intragranular defects and shock sensitivity of RDX/HMX

Cheng Hua; Ming Huang; Hui Huang; Jin Shan Li; Fu De Nie; Bin Dai

doi:10.3969/j.issn.1006-9941.2010.02.007

Intragranular defects and shock sensitivity of RDX/HMX

Cheng Hua, Ming Huang, Hui Huang, Jin Shan Li, Fu De Nie, Bin Dai

China Academy of Engineering Physics

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

The crystal internal defects of RDX/HMX were studied by optical microscopy with matching refractive(OMS), small angle scattering of X-ray(SASX), atomic force microscope(AFM), sink-fload method(SFM) and Mirco-CT. OMS and AFM results show that RDX/HMX has more defects and cracks than reduced sensitivity-RDX/reduced sensitivity-HMX. SASX results show that crystal internal defects of RDX/HMX are larger than that of RS-RDX/RS-HMX, and mirco-CT results show that RDX has larger internal defects than RS-RDX. Furthermore, shock sensitivity of RDX based PBXs and RS-RDX based PBXs were studied, and the results show that internal defects of RDX has great influence on shock sensitivity of RDX.

Original language	English
Pages (from-to)	152-156
Number of pages	5
Journal	Hanneng Cailiao/Chinese Journal of Energetic Materials
Volume	18
Issue number	2
DOIs	https://doi.org/10.3969/j.issn.1006-9941.2010.02.007
State	Published - Apr 2010
Externally published	Yes

Keywords

Characterization method
Crystal internal defect
Explosion mechanics
Reduced sensitivity HMX
Reduced sensitivity RDX
Shock sensitivity

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title = "Intragranular defects and shock sensitivity of RDX/HMX",

abstract = "The crystal internal defects of RDX/HMX were studied by optical microscopy with matching refractive(OMS), small angle scattering of X-ray(SASX), atomic force microscope(AFM), sink-fload method(SFM) and Mirco-CT. OMS and AFM results show that RDX/HMX has more defects and cracks than reduced sensitivity-RDX/reduced sensitivity-HMX. SASX results show that crystal internal defects of RDX/HMX are larger than that of RS-RDX/RS-HMX, and mirco-CT results show that RDX has larger internal defects than RS-RDX. Furthermore, shock sensitivity of RDX based PBXs and RS-RDX based PBXs were studied, and the results show that internal defects of RDX has great influence on shock sensitivity of RDX.",

keywords = "Characterization method, Crystal internal defect, Explosion mechanics, Reduced sensitivity HMX, Reduced sensitivity RDX, Shock sensitivity",

author = "Cheng Hua and Ming Huang and Hui Huang and Li, {Jin Shan} and Nie, {Fu De} and Bin Dai",

year = "2010",

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doi = "10.3969/j.issn.1006-9941.2010.02.007",

language = "英语",

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issn = "1006-9941",

publisher = "Institute of Chemical Materials, China Academy of Engineering Physics",

number = "2",

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T1 - Intragranular defects and shock sensitivity of RDX/HMX

AU - Hua, Cheng

AU - Huang, Ming

AU - Huang, Hui

AU - Li, Jin Shan

AU - Nie, Fu De

AU - Dai, Bin

PY - 2010/4

Y1 - 2010/4

N2 - The crystal internal defects of RDX/HMX were studied by optical microscopy with matching refractive(OMS), small angle scattering of X-ray(SASX), atomic force microscope(AFM), sink-fload method(SFM) and Mirco-CT. OMS and AFM results show that RDX/HMX has more defects and cracks than reduced sensitivity-RDX/reduced sensitivity-HMX. SASX results show that crystal internal defects of RDX/HMX are larger than that of RS-RDX/RS-HMX, and mirco-CT results show that RDX has larger internal defects than RS-RDX. Furthermore, shock sensitivity of RDX based PBXs and RS-RDX based PBXs were studied, and the results show that internal defects of RDX has great influence on shock sensitivity of RDX.

AB - The crystal internal defects of RDX/HMX were studied by optical microscopy with matching refractive(OMS), small angle scattering of X-ray(SASX), atomic force microscope(AFM), sink-fload method(SFM) and Mirco-CT. OMS and AFM results show that RDX/HMX has more defects and cracks than reduced sensitivity-RDX/reduced sensitivity-HMX. SASX results show that crystal internal defects of RDX/HMX are larger than that of RS-RDX/RS-HMX, and mirco-CT results show that RDX has larger internal defects than RS-RDX. Furthermore, shock sensitivity of RDX based PBXs and RS-RDX based PBXs were studied, and the results show that internal defects of RDX has great influence on shock sensitivity of RDX.

KW - Characterization method

KW - Crystal internal defect

KW - Explosion mechanics

KW - Reduced sensitivity HMX

KW - Reduced sensitivity RDX

KW - Shock sensitivity

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JO - Hanneng Cailiao/Chinese Journal of Energetic Materials

JF - Hanneng Cailiao/Chinese Journal of Energetic Materials

IS - 2

ER -

Intragranular defects and shock sensitivity of RDX/HMX

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Keywords

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