Abstract
The lattice parameter c of highly textured YBCO thick films were calculated using X-ray diffraction dual-line method. The lattice parameters of samples prepared on Ni substrate were rather smaller than those of sintered samples and thick films prepared on Ag-Pd substrate. Increasing the substrate temperature during spraying, the sintering temperature after spraying, and the moving speed of samples during zone melting all make lattice parameter c decrease. The samples which have higher Tc generally have rather smaller lattice parameter c.
| Original language | English |
|---|---|
| Pages (from-to) | 26-30 |
| Number of pages | 5 |
| Journal | Xiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering |
| Volume | 23 |
| Issue number | 1 |
| State | Published - Feb 1994 |
| Externally published | Yes |
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