Highly efficient solution-processed phosphorescent organic light-emitting devices with double-stacked hole injection layers

Yuehua Chen; Lin Hao; Xinwen Zhang; Xiaolin Zhang; Mengjiao Liu; Mengke Zhang; Jiong Wang; Wen Yong Lai; Wei Huang

doi:10.1063/1.4998449

Highly efficient solution-processed phosphorescent organic light-emitting devices with double-stacked hole injection layers

Yuehua Chen
, Lin Hao
, Xinwen Zhang
, Xiaolin Zhang
, Mengjiao Liu
, Mengke Zhang
, Jiong Wang
, Wen Yong Lai
, Wei Huang

Nanjing University of Posts and Telecommunications
Nanjing Tech University

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

In this paper, solution-processed nickel oxide (NiO_x) is used as hole-injection layers (HILs) in solution-processed phosphorescent organic light-emitting diodes (PhOLEDs). Serious exciton quenching is verified at the NiO_x/emitting layer (EML) interface, resulting in worse device performance. The device performance is significantly improved by inserting a layer of poly(3,4-ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDOT:PSS) between the EML and NiO_x. The solution-processed blue PhOLED with the double-stacked NiO_x/PEDOT:PSS HILs shows a maximum current efficiency of 30.5 cd/A, which is 75% and 30% higher than those of the devices with a single NiO_x HIL and a PEDOT:PSS HIL, respectively. Improvement of device efficiency can be attributed to reducing exciton quenching of the PEDOT:PSS layer as well as the electron blocking effect of the NiO_x layer.

Original language	English
Article number	065304
Journal	Journal of Applied Physics
Volume	122
Issue number	6
DOIs	https://doi.org/10.1063/1.4998449
State	Published - 14 Aug 2017
Externally published	Yes

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@article{78b0fe221b834eda89ecfe0237dcfb79,

title = "Highly efficient solution-processed phosphorescent organic light-emitting devices with double-stacked hole injection layers",

abstract = "In this paper, solution-processed nickel oxide (NiOx) is used as hole-injection layers (HILs) in solution-processed phosphorescent organic light-emitting diodes (PhOLEDs). Serious exciton quenching is verified at the NiOx/emitting layer (EML) interface, resulting in worse device performance. The device performance is significantly improved by inserting a layer of poly(3,4-ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDOT:PSS) between the EML and NiOx. The solution-processed blue PhOLED with the double-stacked NiOx/PEDOT:PSS HILs shows a maximum current efficiency of 30.5 cd/A, which is 75\% and 30\% higher than those of the devices with a single NiOx HIL and a PEDOT:PSS HIL, respectively. Improvement of device efficiency can be attributed to reducing exciton quenching of the PEDOT:PSS layer as well as the electron blocking effect of the NiOx layer.",

author = "Yuehua Chen and Lin Hao and Xinwen Zhang and Xiaolin Zhang and Mengjiao Liu and Mengke Zhang and Jiong Wang and Lai, \{Wen Yong\} and Wei Huang",

note = "Publisher Copyright: {\textcopyright} 2017 Author(s).",

year = "2017",

month = aug,

day = "14",

doi = "10.1063/1.4998449",

language = "英语",

volume = "122",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Highly efficient solution-processed phosphorescent organic light-emitting devices with double-stacked hole injection layers

AU - Chen, Yuehua

AU - Hao, Lin

AU - Zhang, Xinwen

AU - Zhang, Xiaolin

AU - Liu, Mengjiao

AU - Zhang, Mengke

AU - Wang, Jiong

AU - Lai, Wen Yong

AU - Huang, Wei

PY - 2017/8/14

Y1 - 2017/8/14

N2 - In this paper, solution-processed nickel oxide (NiOx) is used as hole-injection layers (HILs) in solution-processed phosphorescent organic light-emitting diodes (PhOLEDs). Serious exciton quenching is verified at the NiOx/emitting layer (EML) interface, resulting in worse device performance. The device performance is significantly improved by inserting a layer of poly(3,4-ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDOT:PSS) between the EML and NiOx. The solution-processed blue PhOLED with the double-stacked NiOx/PEDOT:PSS HILs shows a maximum current efficiency of 30.5 cd/A, which is 75% and 30% higher than those of the devices with a single NiOx HIL and a PEDOT:PSS HIL, respectively. Improvement of device efficiency can be attributed to reducing exciton quenching of the PEDOT:PSS layer as well as the electron blocking effect of the NiOx layer.

AB - In this paper, solution-processed nickel oxide (NiOx) is used as hole-injection layers (HILs) in solution-processed phosphorescent organic light-emitting diodes (PhOLEDs). Serious exciton quenching is verified at the NiOx/emitting layer (EML) interface, resulting in worse device performance. The device performance is significantly improved by inserting a layer of poly(3,4-ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDOT:PSS) between the EML and NiOx. The solution-processed blue PhOLED with the double-stacked NiOx/PEDOT:PSS HILs shows a maximum current efficiency of 30.5 cd/A, which is 75% and 30% higher than those of the devices with a single NiOx HIL and a PEDOT:PSS HIL, respectively. Improvement of device efficiency can be attributed to reducing exciton quenching of the PEDOT:PSS layer as well as the electron blocking effect of the NiOx layer.

UR - https://www.scopus.com/pages/publications/85027255887

U2 - 10.1063/1.4998449

DO - 10.1063/1.4998449

M3 - 文章

AN - SCOPUS:85027255887

SN - 0021-8979

VL - 122

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 6

M1 - 065304

ER -

Highly efficient solution-processed phosphorescent organic light-emitting devices with double-stacked hole injection layers

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