Skip to main navigation Skip to search Skip to main content

High-Quality Label Learning in Generalized Category Discovery

  • Yu Duan
  • , Junzhi He
  • , Feiping Nie
  • , Quanxue Gao
  • , Cheng Deng
  • Northwestern Polytechnical University Xian
  • Xidian University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Generalized Category Discovery (GCD) is a recently proposed open-world problem that aims to automatically classify and discover new categories based on partially labeled data. For unlabeled data, previous research commonly considers using pseudo-labels to assist in model learning. These pseudo-labels, together with the true labels of labeled data, form the learning targets for the final classifier, leading to better predictive outcomes. However, low-quality labels can inevitably hinder the learning process of the model. To address this issue, inspired by previous methods, we propose the Calibrated Generalized Category Discovery (CGCD) framework, which incorporates a projection head, a classifier head, and a calibration head. The projection head is used for representation learning. The calibration head learns high-quality labels from the robust predictions of the classifier head, and the classifier head utilizes these high-quality labels for more efficient learning. Both heads mutually enhance each other during training, ultimately leading to a superior solution. In addition, leveraging the characteristics of both the classifier head and calibration head, we designed a classifier representation distribution regularization term to further ensure consistency in their learning processes. Extensive experimental results demonstrate that the proposed CGCD framework achieves state-of-the-art performance across five general and fine-grained visual recognition datasets by leveraging high-quality label learning.

Original languageEnglish
Title of host publicationProceedings - 25th IEEE International Conference on Data Mining, ICDM 2025
EditorsWei Ding, Jilles Vreeken, Chang-Tien Lu, Dimitrios Gunopulos, Xindong Wu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages228-236
Number of pages9
ISBN (Electronic)9798331595999
DOIs
StatePublished - 2025
Externally publishedYes
Event25th IEEE International Conference on Data Mining, ICDM 2025 - Washington, United States
Duration: 12 Nov 202515 Nov 2025

Publication series

NameProceedings - IEEE International Conference on Data Mining, ICDM
ISSN (Print)1550-4786

Conference

Conference25th IEEE International Conference on Data Mining, ICDM 2025
Country/TerritoryUnited States
CityWashington
Period12/11/2515/11/25

Keywords

  • generalized category discovery
  • high-quality label learning
  • Open-world semi-supervised learning

Fingerprint

Dive into the research topics of 'High-Quality Label Learning in Generalized Category Discovery'. Together they form a unique fingerprint.

Cite this