Fusion of pairwise nearest-neighbor classifiers based on pairwise-weighted distance metric and Dempster-Shafer theory

Lianmeng Jiao, Thierry Denoux, Quan Pan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The performance of the nearest-neighbor (NN) classifier is known to be very sensitive to the distance metric used in classifying a query pattern, especially in scarce-prototype cases. In this paper, a pairwise-weighted (PW) distance metric related to pairs of class labels is proposed. Compared with the existing distance metrics, it provides more flexibility to design the feature weights so that the local specifics in feature space can be well characterized. Base on the proposed PW distance metric, a polychotomous NN classification problem is solved by combining several pairwise NN (PNN) classifiers within the framework of Dempster-Shafer theory to deal with the uncertain output information. Two experiments based on synthetic and real data sets were carried out to show the effectiveness of the proposed method.

Original languageEnglish
Title of host publicationFUSION 2014 - 17th International Conference on Information Fusion
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9788490123553
StatePublished - 3 Oct 2014
Event17th International Conference on Information Fusion, FUSION 2014 - Salamanca, Spain
Duration: 7 Jul 201410 Jul 2014

Publication series

NameFUSION 2014 - 17th International Conference on Information Fusion

Conference

Conference17th International Conference on Information Fusion, FUSION 2014
Country/TerritorySpain
CitySalamanca
Period7/07/1410/07/14

Keywords

  • Dempster-Shafer theory
  • nearest-neighbor classifier
  • pairwise-weighted distance metric
  • pattern classification

Fingerprint

Dive into the research topics of 'Fusion of pairwise nearest-neighbor classifiers based on pairwise-weighted distance metric and Dempster-Shafer theory'. Together they form a unique fingerprint.

Cite this