TY - GEN
T1 - Facial expression recognition based on local binary patterns and coarse-to-fine classification
AU - Feng, Xiaoyi
PY - 2004
Y1 - 2004
N2 - Automatic facial expression recognition for novel individuals from static images is a challenge task to pattern analysis research community. In this paper, we present an effective method for this task. We analyze seven basic expressions: angry, disgust, fear, happiness, neutral, sadness and surprise. First, the Local Binary Pattern (LBP) operator is used to extract face appearance features. Then a two-stage classification method is proposed. At the first (coarse classification) stage, two expression candidates from initial seven are selected. At the second (fine classification) stage, one of the two candidate classes is verified as final expression class. Our algorithm is tested on the JAFFE database and promising results are obtained.
AB - Automatic facial expression recognition for novel individuals from static images is a challenge task to pattern analysis research community. In this paper, we present an effective method for this task. We analyze seven basic expressions: angry, disgust, fear, happiness, neutral, sadness and surprise. First, the Local Binary Pattern (LBP) operator is used to extract face appearance features. Then a two-stage classification method is proposed. At the first (coarse classification) stage, two expression candidates from initial seven are selected. At the second (fine classification) stage, one of the two candidate classes is verified as final expression class. Our algorithm is tested on the JAFFE database and promising results are obtained.
UR - https://www.scopus.com/pages/publications/9744241072
M3 - 会议稿件
AN - SCOPUS:9744241072
SN - 0769522165
T3 - Proceedings - The Fourth International Conference on Computer and Information Technology (CIT 2004)
SP - 178
EP - 183
BT - Proceedings - The Fourth International Conference on Computer and Information Technology (CIT 2004)
A2 - Wei, D.
A2 - Wang, H.
A2 - Peng, Z.
A2 - Kara, A.
A2 - He, Y.
T2 - Proceedings - The Fourth International Conference on Computer and Information Technology (CIT 2004)
Y2 - 14 September 2004 through 16 September 2004
ER -