Expanded SPAN for Efficient Super-Resolution

  • Qing Wang
  • , Yan Wang
  • , Hongyu An
  • , Yi Liu
  • , Liou Zhang
  • , Shijie Zhao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This work proposes ESPAN, an efficient super-resolution (SR) network that extracts robust representations with constrained parameters by incorporating innovations from three perspectives: self-distillation and progressive learning (SDPL), general re-parameterization (GRep), and frequency-aware loss. In detail, SDPL shares partial blocks between the student and teacher models and progressively removes the tail convolutions of the student model, which contributes to a stable training process and reasonable convergence. Regarding GRep, we provide a more general schema of re-parameterization with interpretable theoretical derivation to achieve more flexible expansion of re-parameterization complexity. The frequency-aware loss utilizes the discrete cosine transform and a high-pass filter, enforcing the model to focus more on important high-frequency areas. The experimental results demonstrate the effectiveness of the proposed strategies. Overall, ESPAN exhibits better generality and robustness than previous top-ranking solutions in the NTIRE ESR challenge (e.g., 0.33 dB higher than SPAN on Manga109) while maintaining inference and restoration performance.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2025
PublisherIEEE Computer Society
Pages958-967
Number of pages10
ISBN (Electronic)9798331599942
DOIs
StatePublished - 2025
Externally publishedYes
Event2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2025 - Nashville, United States
Duration: 11 Jun 202512 Jun 2025

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2025
Country/TerritoryUnited States
CityNashville
Period11/06/2512/06/25

Keywords

  • distillation
  • efficient super-resolution
  • re-parameterization

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