Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors

Jian Guo Zheng; Qi Li; Duan Feng; Shi Yin Ding; Shi Dong Yu; Guang Jun Shen; Feng Sheng Liu; Lian Zhou; Hui Lin Mou

doi:10.1063/1.352117

Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors

Jian Guo Zheng
, Qi Li
, Duan Feng
, Shi Yin Ding
, Shi Dong Yu
, Guang Jun Shen
, Feng Sheng Liu
, Lian Zhou
, Hui Lin Mou

Nanjing University
Southeast University, Nanjing
Northwest Institute for Nonferrous Metal Research

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Electron microscopy shows that textured Y-Ba-Cu-O superconductors contain many partial dislocations associated with stacking faults in a-b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, -b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults.

Original language	English
Pages (from-to)	4634-4637
Number of pages	4
Journal	Journal of Applied Physics
Volume	72
Issue number	10
DOIs	https://doi.org/10.1063/1.352117
State	Published - 1992
Externally published	Yes

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title = "Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors",

abstract = "Electron microscopy shows that textured Y-Ba-Cu-O superconductors contain many partial dislocations associated with stacking faults in a-b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, -b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults.",

author = "Zheng, \{Jian Guo\} and Qi Li and Duan Feng and Ding, \{Shi Yin\} and Yu, \{Shi Dong\} and Shen, \{Guang Jun\} and Liu, \{Feng Sheng\} and Lian Zhou and Mou, \{Hui Lin\}",

year = "1992",

doi = "10.1063/1.352117",

language = "英语",

volume = "72",

pages = "4634--4637",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "10",

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TY - JOUR

T1 - Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors

AU - Zheng, Jian Guo

AU - Li, Qi

AU - Feng, Duan

AU - Ding, Shi Yin

AU - Yu, Shi Dong

AU - Shen, Guang Jun

AU - Liu, Feng Sheng

AU - Zhou, Lian

AU - Mou, Hui Lin

PY - 1992

Y1 - 1992

N2 - Electron microscopy shows that textured Y-Ba-Cu-O superconductors contain many partial dislocations associated with stacking faults in a-b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, -b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults.

AB - Electron microscopy shows that textured Y-Ba-Cu-O superconductors contain many partial dislocations associated with stacking faults in a-b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, -b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults.

UR - https://www.scopus.com/pages/publications/26844531397

U2 - 10.1063/1.352117

DO - 10.1063/1.352117

M3 - 文章

AN - SCOPUS:26844531397

SN - 0021-8979

VL - 72

SP - 4634

EP - 4637

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10

ER -

Electron microscopic study of partial dislocations in textured Y-Ba-Cu-O superconductors

Abstract

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