Abstract
The effects of the applied negative bias voltage on the hydrogen content, refractive index, extinction coefficient, internal stress, Vickers microhardness, adhesion and growth rate of a-C : H films deposited from a C2H2 + Ar mixture by a d.c.-r.f. plasma-enhanced chemical vapour deposition process have been investigated. The results showed that the properties of a-C : H films strongly depend on the applied bias voltage. In the investigated bias range (-400 to -1000 V), it was found that, apart from the growth rate and extinction coefficient (which were found to increase with increasing bias), all the other properties studied showed a maximum at around -800 to -900 V. Compared with those studies reported previously on self-bias voltage effects, these results indicated a slight difference between the effects of the self-bias voltage and applied bias voltage. The experimental results are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 31-36 |
| Number of pages | 6 |
| Journal | Surface and Coatings Technology |
| Volume | 78 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - Jan 1996 |
Keywords
- A-C:H films
- Applied bias
- d.c.-r.f. PECVD
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