TY - GEN
T1 - Effect of yield hardening on plastic deformation of metal contact interface
AU - Deng, Lichuan
AU - Luo, Bin
AU - Cheng, Hui
AU - Lin, Wei
AU - Cheng, Lixin
AU - Wang, Qingsong
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021
Y1 - 2021
N2 - Metal contact has a pivotal role in various engineering situations, such as hydraulic sealing, wear, tribology, and so on. Under extreme contact pressure, metal surfaces deform plastically and yield hardening occurs, which forms a better sealing interface. In order to predict the plastic deformation more accurately, we propose a novel method considering yield hardening to calculate the stress distribution and plastic deformation of the contact interface. The analysis results are well agreed with the experimental results. Characterization of plastic deformation is important for our increased understanding of sealing performance.
AB - Metal contact has a pivotal role in various engineering situations, such as hydraulic sealing, wear, tribology, and so on. Under extreme contact pressure, metal surfaces deform plastically and yield hardening occurs, which forms a better sealing interface. In order to predict the plastic deformation more accurately, we propose a novel method considering yield hardening to calculate the stress distribution and plastic deformation of the contact interface. The analysis results are well agreed with the experimental results. Characterization of plastic deformation is important for our increased understanding of sealing performance.
KW - Computational Mechanics
KW - Contact mechanics
KW - Hydraulic sealing interface
KW - Plastic deformation
KW - Stress distribution
KW - Yield hardening
UR - http://www.scopus.com/inward/record.url?scp=85126941934&partnerID=8YFLogxK
U2 - 10.1109/IAECST54258.2021.9695872
DO - 10.1109/IAECST54258.2021.9695872
M3 - 会议稿件
AN - SCOPUS:85126941934
T3 - 2021 3rd International Academic Exchange Conference on Science and Technology Innovation, IAECST 2021
SP - 1975
EP - 1980
BT - 2021 3rd International Academic Exchange Conference on Science and Technology Innovation, IAECST 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 3rd International Academic Exchange Conference on Science and Technology Innovation, IAECST 2021
Y2 - 10 December 2021 through 12 December 2021
ER -