Dielectric behavior and phase transition of perovskite PMN-PT films

Huiqing Fan; Jin Chen

doi:10.1088/0031-8949/2010/T139/014039

Dielectric behavior and phase transition of perovskite PMN-PT films

Huiqing Fan
, Jin Chen

School of Materials Sience and Engineering

Northwestern Polytechnical University Xian
Xi'an University of Architecture and Technology

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

The dielectric properties of perovskite relaxor ferroelectrics 0.80Pb(Mg_1/3Nb_2/3)O₃-0.20PbTiO₃ (0.80PMN-0.20PT) thick films fabricated by electrophoretic deposition were investigated as a function of temperature and frequency. The phase transformation of 0.80PMN-0.20PT thick films has two different kinds of phase transition: one is a diffused phase transition around the temperature of dielectric permittivity maxima and the other is a first-order transition from frequency dispersion relaxor ferroelectrics to normal ferroelectrics. The frequency and temperature dependence of the dielectric permittivity maximum was also analyzed to discuss the physical meaning of the Debey, Vogel-Fulcher (V-F) and new-glass (N-G) relations. It is shown that the N-G relation is more suitable to characterize the relaxation behavior than the Debey and V-F relations.

Original language	English
Article number	014039
Journal	Physica Scripta T
Volume	T139
DOIs	https://doi.org/10.1088/0031-8949/2010/T139/014039
State	Published - 2010
Event	3rd International Symposium on Functional Materials 2009, ISFM 2009 - Jinju, Korea, Republic of Duration: 15 Jun 2009 → 18 Jun 2009

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10.1088/0031-8949/2010/T139/014039

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@article{30d6f3b580c84988aaf48171f0234901,

title = "Dielectric behavior and phase transition of perovskite PMN-PT films",

abstract = "The dielectric properties of perovskite relaxor ferroelectrics 0.80Pb(Mg1/3Nb2/3)O3-0.20PbTiO3 (0.80PMN-0.20PT) thick films fabricated by electrophoretic deposition were investigated as a function of temperature and frequency. The phase transformation of 0.80PMN-0.20PT thick films has two different kinds of phase transition: one is a diffused phase transition around the temperature of dielectric permittivity maxima and the other is a first-order transition from frequency dispersion relaxor ferroelectrics to normal ferroelectrics. The frequency and temperature dependence of the dielectric permittivity maximum was also analyzed to discuss the physical meaning of the Debey, Vogel-Fulcher (V-F) and new-glass (N-G) relations. It is shown that the N-G relation is more suitable to characterize the relaxation behavior than the Debey and V-F relations.",

author = "Huiqing Fan and Jin Chen",

year = "2010",

doi = "10.1088/0031-8949/2010/T139/014039",

language = "英语",

volume = "T139",

journal = "Physica Scripta T",

issn = "0281-1847",

publisher = "Institute of Physics",

note = "3rd International Symposium on Functional Materials 2009, ISFM 2009 ; Conference date: 15-06-2009 Through 18-06-2009",

}

TY - JOUR

T1 - Dielectric behavior and phase transition of perovskite PMN-PT films

AU - Fan, Huiqing

AU - Chen, Jin

PY - 2010

Y1 - 2010

N2 - The dielectric properties of perovskite relaxor ferroelectrics 0.80Pb(Mg1/3Nb2/3)O3-0.20PbTiO3 (0.80PMN-0.20PT) thick films fabricated by electrophoretic deposition were investigated as a function of temperature and frequency. The phase transformation of 0.80PMN-0.20PT thick films has two different kinds of phase transition: one is a diffused phase transition around the temperature of dielectric permittivity maxima and the other is a first-order transition from frequency dispersion relaxor ferroelectrics to normal ferroelectrics. The frequency and temperature dependence of the dielectric permittivity maximum was also analyzed to discuss the physical meaning of the Debey, Vogel-Fulcher (V-F) and new-glass (N-G) relations. It is shown that the N-G relation is more suitable to characterize the relaxation behavior than the Debey and V-F relations.

AB - The dielectric properties of perovskite relaxor ferroelectrics 0.80Pb(Mg1/3Nb2/3)O3-0.20PbTiO3 (0.80PMN-0.20PT) thick films fabricated by electrophoretic deposition were investigated as a function of temperature and frequency. The phase transformation of 0.80PMN-0.20PT thick films has two different kinds of phase transition: one is a diffused phase transition around the temperature of dielectric permittivity maxima and the other is a first-order transition from frequency dispersion relaxor ferroelectrics to normal ferroelectrics. The frequency and temperature dependence of the dielectric permittivity maximum was also analyzed to discuss the physical meaning of the Debey, Vogel-Fulcher (V-F) and new-glass (N-G) relations. It is shown that the N-G relation is more suitable to characterize the relaxation behavior than the Debey and V-F relations.

UR - https://www.scopus.com/pages/publications/77954752420

U2 - 10.1088/0031-8949/2010/T139/014039

DO - 10.1088/0031-8949/2010/T139/014039

M3 - 会议文章

AN - SCOPUS:77954752420

SN - 0281-1847

VL - T139

JO - Physica Scripta T

JF - Physica Scripta T

M1 - 014039

T2 - 3rd International Symposium on Functional Materials 2009, ISFM 2009

Y2 - 15 June 2009 through 18 June 2009

ER -

Dielectric behavior and phase transition of perovskite PMN-PT films

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