Detection of Defects in Film-Coated Metals and Non-Metallic Materials Based on Spoof Surface Plasmon Polaritons

Xiaoqing Yang, Junlong Chen, Piqiang Su, Xuexue Lei, Jing Lei, Yi Xie, Jianping Yuan, Zhanxia Zhu

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

A novel sensor based on spoof surface plasmon polaritons is presented to detect defects in film-coated metals and non-metallic materials. The sensor is a flexible strip that can be easily wound around various shapes of the material under test (MUT) and by scanning the surface of MUT with the designed sensor, the defects of the MUT can be detected. Since the sensitive area of the sensor is strip-shaped, the detection only needs to be scanned in one direction (most sensors need to scan in two orthogonal directions) which improves the detection speed and reduces the complexity of detection process. The detection are based on monitoring change of the transmission coefficient which is caused by the disturbation of electromagnetic field around the spoof surface plasmon polaritons. The sensor is flexible, sensitive and the detection speed is fast.

Original languageEnglish
Article number8822454
Pages (from-to)11891-11899
Number of pages9
JournalIEEE Sensors Journal
Volume19
Issue number24
DOIs
StatePublished - 15 Dec 2019

Keywords

  • metallic material
  • microwave non-destructive testing
  • non-metallic material
  • Spoof surface plasmon polaritons (SSPPs)

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