Defects formation mechanism and control of SiC coatings by chemical vapor deposition

Shoujun Wu, Laifei Cheng, Litong Zhang, Yongdong Xu, Jixiong Shen

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The surface and cross section micro-morphologies of silicon carbide anti-oxidation coatings deposited by chemical vapor deposition (CVD) were observed by scanning electron microscope. The formation mechanism of coating cracks, net-defects, and plane-defects were investigated. The defects control of the coatings was discussed based on the CVD process. Slow deposition is favorable to the coating defects control, especially to the plane-defects. Multilayer coatings without the plane-defects can be obtained by the slow deposition. Oxidation tests indicate that the three dimensional C/SiC with the slow deposition coatings shows the increase of mass of slow oxidation in air at 1300°C.

Original languageEnglish
Pages (from-to)443-446
Number of pages4
JournalKuei Suan Jen Hsueh Pao/Journal of the Chinese Ceramic Society
Volume33
Issue number4
StatePublished - Apr 2005

Keywords

  • Defects control
  • Formation mechanism
  • Silicon carbide coating

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