Deep Unsupervised Binary Descriptor Learning through Locality Consistency and Self Distinctiveness

Bin Fan, Hongmin Liu, Hui Zeng, Jiyong Zhang, Xin Liu, Junwei Han

Research output: Contribution to journalArticlepeer-review

28 Scopus citations

Abstract

Deep learning has been successfully applied to learn local feature descriptors in recent years. However, most of existing methods are supervised methods relying on a large number of labeled training patches, which are also proposed for learning real valued descriptors. In this paper, we propose a novel unsupervised deep learning method for binary descriptor learning. The binary descriptors are much more compact and efficient than the real valued descriptors and unsupervised leaning is highly required in many applications due to its label-free characteristic as the annotations are sometimes expensive to obtain. The core idea of our method is to explore the locality consistency in the descriptor space as well as to distinguish different patches while maintaining the ability to match a patch with its geometric transformed ones. We also give a theorical analysis about the role of batch normalization in learning effective binary descriptors. Benefited from this analysis, there is no need to append two additional losses on minimizing the quantization error and maximizing the entropy to the final learning objective like previous works did, thus simplifying our network training. Experiments on four benchmarks demonstrate that the proposed method is able to learn binary descriptors significantly outperforming previous unsupervised binary descriptors, even superior to most supervised ones. Especially, it obtains 21.2% of improvement on the UBC Phototour dataset, and 19.8%, 26.7%, 26.0% of improvements for patch verification, matching, retrieval tasks respectively on the HPatches dataset compared to the previous best unsupervised method.

Original languageEnglish
Article number9169844
Pages (from-to)2770-2781
Number of pages12
JournalIEEE Transactions on Multimedia
Volume23
DOIs
StatePublished - 2021
Externally publishedYes

Keywords

  • compact descriptor
  • deep learning
  • feature extraction
  • image retrieval
  • mobile applications
  • pattern matching
  • Unsupervised learning

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