@inproceedings{12dba8344dc94e08bf1a7ee36e6b069d,
title = "Contrastive Deep Knowledge Tracing",
abstract = "Knowledge tracing (KT) aims to predict student performance on the next question according to historical records. Recently deep learning-based models for KT task successfully modeling student responses receive good prediction results of student performance. The student responses encoded as input of KT models use a one-hot encoding. We find that one-hot encoding represents student responses on different items related to the same concepts in completely different vectors. However, items related to the same concept have certain relationships in the real world so the student has a similar representation in these items. In this paper, we propose a new method named Contrastive Deep Knowledge Tracing (CDKT) for providing a reasonable representation of students. We evaluate our model using three public benchmark datasets and the experimental results demonstrate improvements over state-of-the-art methods.",
keywords = "Contrastive learning, Deep learning, Knowledge tracing",
author = "Huan Dai and Yue Yun and Yupei Zhang and Wenxin Zhang and Xuequn Shang",
note = "Publisher Copyright: {\textcopyright} 2022, Springer Nature Switzerland AG.; 23rd International Conference on Artificial Intelligence in Education, AIED 2022 ; Conference date: 27-07-2022 Through 31-07-2022",
year = "2022",
doi = "10.1007/978-3-031-11647-6\_54",
language = "英语",
isbn = "9783031116469",
series = "Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)",
publisher = "Springer Science and Business Media Deutschland GmbH",
pages = "289--292",
editor = "Rodrigo, \{Maria Mercedes\} and Noburu Matsuda and Cristea, \{Alexandra I.\} and Vania Dimitrova",
booktitle = "Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners{\textquoteright} and Doctoral Consortium - 23rd International Conference, AIED 2022, Proceedings",
}