Characterization of various interfaces in a TiAl-based alloy

Xiangyu Gao; Jie Wang; Dan Feng; Xiubo Yang; Rui Hu; Yulun Wu; Zitong Gao; Feng Liu

doi:10.1016/j.matchar.2022.112056

Characterization of various interfaces in a TiAl-based alloy

Xiangyu Gao
, Jie Wang
, Dan Feng
, Xiubo Yang
, Rui Hu
, Yulun Wu
, Zitong Gao
, Feng Liu

School of Materials Sience and Engineering

Northwestern Polytechnical University Xian

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

As for a two phase TiAl-based alloy, γ/α₂ lamellar structure has been studied, where, various atomic microstructures for interfaces generated by phase transformation and recrystallization upon high-temperature compression have been studied. As expected, mixed interfaces including phase boundary (PB), true twin (TT), pseudo-twin (PT), 120° rotational boundary (RB) and large angle grain boundary (LAGB) can be observed in the as-formed structure. A detailed characterization using high resolution electron microscopy has been performed, which helps to obtaining the optimum microstructure and the corresponding excellent mechanical properties of the TiAl alloy.

Original language	English
Article number	112056
Journal	Materials Characterization
Volume	190
DOIs	https://doi.org/10.1016/j.matchar.2022.112056
State	Published - Aug 2022

Keywords

120° rotational boundary
High resolution electron microscopy
Phase boundary
Pseudo-twin
TiAl alloy
True twin

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10.1016/j.matchar.2022.112056

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title = "Characterization of various interfaces in a TiAl-based alloy",

abstract = "As for a two phase TiAl-based alloy, γ/α2 lamellar structure has been studied, where, various atomic microstructures for interfaces generated by phase transformation and recrystallization upon high-temperature compression have been studied. As expected, mixed interfaces including phase boundary (PB), true twin (TT), pseudo-twin (PT), 120° rotational boundary (RB) and large angle grain boundary (LAGB) can be observed in the as-formed structure. A detailed characterization using high resolution electron microscopy has been performed, which helps to obtaining the optimum microstructure and the corresponding excellent mechanical properties of the TiAl alloy.",

keywords = "120° rotational boundary, High resolution electron microscopy, Phase boundary, Pseudo-twin, TiAl alloy, True twin",

author = "Xiangyu Gao and Jie Wang and Dan Feng and Xiubo Yang and Rui Hu and Yulun Wu and Zitong Gao and Feng Liu",

note = "Publisher Copyright: {\textcopyright} 2022",

year = "2022",

month = aug,

doi = "10.1016/j.matchar.2022.112056",

language = "英语",

volume = "190",

journal = "Materials Characterization",

issn = "1044-5803",

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TY - JOUR

T1 - Characterization of various interfaces in a TiAl-based alloy

AU - Gao, Xiangyu

AU - Wang, Jie

AU - Feng, Dan

AU - Yang, Xiubo

AU - Hu, Rui

AU - Wu, Yulun

AU - Gao, Zitong

AU - Liu, Feng

PY - 2022/8

Y1 - 2022/8

N2 - As for a two phase TiAl-based alloy, γ/α2 lamellar structure has been studied, where, various atomic microstructures for interfaces generated by phase transformation and recrystallization upon high-temperature compression have been studied. As expected, mixed interfaces including phase boundary (PB), true twin (TT), pseudo-twin (PT), 120° rotational boundary (RB) and large angle grain boundary (LAGB) can be observed in the as-formed structure. A detailed characterization using high resolution electron microscopy has been performed, which helps to obtaining the optimum microstructure and the corresponding excellent mechanical properties of the TiAl alloy.

AB - As for a two phase TiAl-based alloy, γ/α2 lamellar structure has been studied, where, various atomic microstructures for interfaces generated by phase transformation and recrystallization upon high-temperature compression have been studied. As expected, mixed interfaces including phase boundary (PB), true twin (TT), pseudo-twin (PT), 120° rotational boundary (RB) and large angle grain boundary (LAGB) can be observed in the as-formed structure. A detailed characterization using high resolution electron microscopy has been performed, which helps to obtaining the optimum microstructure and the corresponding excellent mechanical properties of the TiAl alloy.

KW - 120° rotational boundary

KW - High resolution electron microscopy

KW - Phase boundary

KW - Pseudo-twin

KW - TiAl alloy

KW - True twin

UR - https://www.scopus.com/pages/publications/85132518568

U2 - 10.1016/j.matchar.2022.112056

DO - 10.1016/j.matchar.2022.112056

M3 - 文章

AN - SCOPUS:85132518568

SN - 1044-5803

VL - 190

JO - Materials Characterization

JF - Materials Characterization

M1 - 112056

ER -

Characterization of various interfaces in a TiAl-based alloy

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Keywords

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