CdZnTe thick films deposited by close-spaced sublimation and its properties

Polycrystalline CdZnTe thick films were deposited on glass substrates via close-spaced sublimation (CSS) technique. The morphology, composition, micro-structure, optical and electrical properties of CdZnTe thick films were investigated by SEM, EDS, XRD, UV spectrophotometer and I-V measurements. It is found that the grains are uniform, also, the grain sizes increase significantly with increasing deposition time. The XRD results show that all the thick films possess cubic structure, and tend to grow along the orientation of (111) face. The optical energy gap of all the thick films are in the region of 1.53-1.56 eV. The resistivity of the films are 10¹⁰Ω·cm orders of magnitude, and have good optical response. It can be used for counting detectors.