Abstract
X-Ray diffraction is used to analyse the lattice structure of Cd 0.96Zn0.04Te (CZT), and the lattice constant is measured to be 0.647 nm. The atomic structure of the clean CZT(110) surface obtained by Ar+ etching in vacuum is observed by low-energy electron diffraction, where no surface reconstruction is discovered. Angle-resolved photoemission spectroscopy was used to characterize the surface state of the clean CZT (110) surface, by which we find a 1.5-eV-wide surface band with the peak at 0.9 eV below the Fermi energy containing about 6.9×1014 electrons/cm2, approximately one electron per surface atom.
| Original language | English |
|---|---|
| Pages (from-to) | 2357-2359 |
| Number of pages | 3 |
| Journal | Chinese Physics Letters |
| Volume | 22 |
| Issue number | 9 |
| DOIs | |
| State | Published - 1 Sep 2005 |
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