@inproceedings{ddfd854d77c94ffeba166e520f85fa5c,
title = "An optical measurement system for high precision alignment of imaging detectors",
abstract = "The assembly positioning state of the imaging detector has an important influence on the performance of the photoelectric reconnaissance system. The axial positioning accuracy of the imaging detector will affect the imaging clarity and resolution, and the radial positioning accuracy will affect the optical axis consistency of the optical path system. The tilt, translation, rotation and position of the detector will bring multi-dimensional errors during the installation of the imaging detector, resulting in image plane misalignment, image blur and optical axis offset. In this paper, an optical measurement system is designed and built, which can automatically distinguish the installation error of the imaging detector and assist the installation of the imaging detector. The translation installation error is less than 0.015mm, and the rotation deflection error is less than 0.015 ', and the installation qualification can be given according to the clarity of the observation system image.",
keywords = "Imaging clarity and resolution, Imaging detector, Installation error, Optical measurement system, alignment",
author = "Zeng, \{X. Chang\} and W. Guan and J. Zhao and P. Huang and Wang, \{Z. Qiang\} and S. Zhang and Zuo, \{X. Zhou\} and Xi, \{G. Yang\} and Yu, \{B. Wei\} and Zhang, \{W. Ping\} and Wang, \{Z. Li\} and X. Zhang and Lv, \{X. Lian\} and Yuan, \{W. Zheng\} and Wang, \{X. Xiao\} and Y. He",
note = "Publisher Copyright: {\textcopyright} 2023 SPIE.; Optical Design and Testing XIII 2023 ; Conference date: 14-10-2023 Through 15-10-2023",
year = "2023",
doi = "10.1117/12.2688965",
language = "英语",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Yongtian Wang and Kidger, \{Tina E.\} and Rengmao Wu",
booktitle = "Optical Design and Testing XIII",
}