A weighting multivariate process capability index

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Process quality ultimately decides on the quality of electronic products. Based on analyzing and improving process capability index (PCI), microelectronics process quality of electronic products may be effectively assured. Nowadays with the rapid development in microelectronics process, Quality evaluation of processes concerns more than one quality characteristics, microelectronics process quality evaluation concerns multi quality characteristics, therefore univariate PCI is difficultly used to synthetically analyze microelectronics process quality. The paper presents a multivariate PCI based on weight factor, which provides references for assuring and improving process quality while achieving overall evaluation of process quality and is not limited to the variable number. An example of calculating multivariate PCI (MPCI) is given. Real application shows that the method presented is effective and actual.

Original languageEnglish
Title of host publicationProceedings - 2010 International Conference on System Science, Engineering Design and Manufacturing Informatization, ICSEM 2010
Pages17-20
Number of pages4
DOIs
StatePublished - 2010
Event2010 International Conference on System Science, Engineering Design and Manufacturing Informatization, ICSEM 2010 - Yichang, China
Duration: 12 Nov 201014 Nov 2010

Publication series

NameProceedings - 2010 International Conference on System Science, Engineering Design and Manufacturing Informatization, ICSEM 2010
Volume1

Conference

Conference2010 International Conference on System Science, Engineering Design and Manufacturing Informatization, ICSEM 2010
Country/TerritoryChina
CityYichang
Period12/11/1014/11/10

Keywords

  • Factor weight
  • Multivariate
  • Process capability index
  • Quality characteristics

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