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A Novel Sapphire-Based MEMS Wall Shear Stress Sensor with Remarkable Thermal Endurance up to 800 °c

  • Yunzhe Liu
  • , Yunjian Chen
  • , Shengming Ma
  • , Chuqiao Wang
  • , Wenlong Wang
  • , Tao Zhang
  • , Yuanying Zhang
  • , Xingxu Zhang
  • , Binghe Ma
  • Northwestern Polytechnical University Xian

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Wall shear stress is one of the key parameters in near-wall turbulent flow, with profound implications for aerodynamic optimization and drag reduction in aerospace systems. This work presents a novel floating optical MEMS sensor for wall shear stress measurement in harsh flow, featuring a sapphire-based sensing microstructure, remarkably enhancing its thermal endurance. By leveraging integrated femtosecond laser ablation and micro-welding with precision polishing of concave cavities, inherent sapphire machinability and bonding challenges are resolved, enabling prototype fabrication. Calibration via a two-dimensional Poiseuille channel demonstrates a static sensitivity of 0.51 mV/Pa and full-scale nonlinearity ≤ 1.2%. The sensor resolves transient shear stress fluctuations during laminar-turbulent transitions with high dynamic response. Crucially, after 15 minute 800° C exposure, functional integrity is maintained with sensitivity drift limited to 3.9%. This technology enables reliable flow diagnostics in high-Mach propulsion and combustion chambers, advancing energy-efficient flow control strategies.

Original languageEnglish
Title of host publicationIEEE SENSORS 2025 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331544676
DOIs
StatePublished - 2025
Event2025 IEEE SENSORS - Vancouver, Canada
Duration: 19 Oct 202522 Oct 2025

Publication series

NameProceedings of IEEE Sensors
ISSN (Print)1930-0395
ISSN (Electronic)2168-9229

Conference

Conference2025 IEEE SENSORS
Country/TerritoryCanada
CityVancouver
Period19/10/2522/10/25

Keywords

  • High temperature measurement
  • MEMS sensor
  • sapphire microstructure
  • wall shear stress

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