@inproceedings{6ed54068aaba4a38b82cb2ce9a94d00b,
title = "A method for assessing soft error rate based on the resource configuration of netlist-level circuit topology in SRAM-based FPGAS",
abstract = "For the effect of signal propagation in the programmable logic device caused by single event effects (SEE) of the space environment, a method for assessing soft error rate based on the resource configuration of netlist-level circuit topology by SEE is proposed in this paper. This method makes use of the mapping relationship between the synthesized netlist and the device resource. Then the construction of signal logical propagation topology is closer to the physical layer through the algorithm of depth first search and the matching rules of control bits. Therefore, the propagation model for assessing soft-error propagation probability among the outputs in system is built based on the logic circuit signal propagation relationship, which is able to enhance the calculation accuracy of soft error rate. Ultimately, an engineering example is verified that this method could be able to effective and better evaluate design effect of mitigating SEE in circuit system.",
keywords = "Circuit nodes, Forward circuit, Soft error rate, SRAM-based FPGA, XDL netlist",
author = "Guochang Zhou and Xiang Gao and Xiaoling Lai and Qi Zhu and Yangming Guo",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 ; Conference date: 19-10-2016 Through 21-10-2016",
year = "2017",
month = jan,
day = "16",
doi = "10.1109/PHM.2016.7819775",
language = "英语",
series = "Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Qiang Miao and Zhaojun Li and Zuo, \{Ming J.\} and Liudong Xing and Zhigang Tian",
booktitle = "Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016",
}