Structure and migration characteristic of heterointerfaces during the phase transformation from L12 to DO22 phase

Mingyi Zhang, Zheng Chen, Yongxin Wang, Jing Zhang, Yan Zhao, Yanli Lu

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Based on the microscopic phase-field model, the structure and migration characteristic of ordered domain interfaces formed between DO22 and L12 phase are investigated, and the atomistic mechanism of phase transformation from L12 (Ni3Al) to DO22 (Ni3V) in Ni75Al x V25-x alloys are explored, using the simulated microstructure evolution pictures and the occupation probability evolution of alloy elements at the interface. The results show that five kinds of heterointerfaces are formed between DO22 and L12 phase and four of them can migrate during the phase transformation from L12 to DO22 except the interface (002)D//(001)L. The structure of interface (100) D//(200)L and interface (100)D//(200) L•1/2[001] remain the same before and after migration, while the interface (002)D//(002)L is formed after the migration of interface (002)D//(002)L•1/2[100] and vice versa. These two kinds of interface appear alternatively. The jump and substitute of atoms selects the optimization way to induce the migration of interface during the phase transformation, and the number of atoms needing to jump during the migration is the least among all of the possible atom jump modes.

Original languageEnglish
Pages (from-to)814-819
Number of pages6
JournalJournal Wuhan University of Technology, Materials Science Edition
Volume25
Issue number5
DOIs
StatePublished - Oct 2010

Keywords

  • interface migration
  • microscopic phase-field
  • NiAl V alloy
  • ordered domain interface
  • phase transformation

Fingerprint

Dive into the research topics of 'Structure and migration characteristic of heterointerfaces during the phase transformation from L12 to DO22 phase'. Together they form a unique fingerprint.

Cite this